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- Computing and Processing
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- Engineered Materials, Dielectrics and Plasmas
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J. Beckmann
Also published under:Jörg Beckmann
Affiliation
Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany
Topic
Attenuated Total Reflectance,Application Areas,Applications In Fields,Curing Process,Empty Cells,Fiber-reinforced Polymer,Fiber-reinforced Polymer Composites,Hydrophilic Surface,Hydrophobic Surface,Measured Spectra,Polar Angle,SiO2 Film,Silicon Wafer,Standard Series,Standard Tracking,Standardised,Terahertz Systems,Transmission Spectra,Detection Of Explosives,Non-destructive Testing,Quantum Cascade Lasers,Refractive Index,Absorption Band,Aging Process,Beam Splitter,Chain Scission,Electromagnetic Pulses,Ellipsometry,Fourier Transform Infrared,Nuclear Waste,Optical Constants,Pelletized,Pulse Sequence,Spectral Resolution,Spectroscopic Ellipsometry,Storage Ring,Synchrotron Radiation,Terahertz,Time-of-flight,Total Reflection,Volume Reconstruction,ATR Crystal,Additional Variables,Anomalous Dispersion,Aromatic Hydrocarbons,Basal Salt,Bending Mode,Biological Agents,Bolometer,Broadband Source,
Biography
Dr. rer. nat. Jörg Beckmann (male) Digital Radiology, Computed Radiography; THz Time Domain Spectroscopy for security applications and non-destructive testing of dielectrics BAM, 8.3 Radiological Methods Unter den Eichen 87, 12205 Berlin, Germany T: +49 30 8104-1443 e-mail: [email protected]