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Florence Azais
Also published under:F. Azais, F. Azaïs, Florence Azaıs, Florence Azaïs, Florence Azaïs
Affiliation
Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM), Montpellier, France
Topic
Digital Channels,Analog Signal,Baseband Signal,Binary Signal,Carrier Frequency,Corruption,Digital Resources,Digital Signal,Inverter,Modulation Index,Modulation Of Signaling,Non-destructive Sampling,Replica,Sampling Frequency,Signal Frequency,Signal Propagation,Spectral Content,Test Stimuli,Area Overhead,Average Relative Error,Binary Phase Shift Keying,Calculation Of Spectra,Candidate List,Compact Model,Correct Output,Correct Value,Cost Of Testing,Critical Path,Defect Model,Defect Size,Delay Increases,Digital Capture,Digital Measurements,Digital Modulation,Digital Oscilloscope,Digital Solutions,Discrete-time Domain,Equivalent Resistance,Fault Location,Fault Simulation,FinFET Technology,Fluctuations In Parameters,Frequency Components,Gate Electrode,Gating Function,Greatest Common Divisor,Harmonic Power,Inductive Load,Industrial Environment,Initial Proposal,
Biography
Florence Azaïs is a researcher for CNRS working in the Microelectronics Department of LIRMM. Her research interests include fault modeling, analog and mixed-signal circuit testing, testing for microelectromechanical systems, and the reliability and failure analysis of integrated systems. Azaïs has a PhD in electrical engineering from the University of Montpellier. He is a member of the IEEE.