Topic
- Computing and Processing
- Components, Circuits, Devices and Systems
- Communication, Networking and Broadcast Technologies
- Power, Energy and Industry Applications
- Signal Processing and Analysis
- Robotics and Control Systems
- General Topics for Engineers
- Fields, Waves and Electromagnetics
- Engineered Materials, Dielectrics and Plasmas
- Bioengineering
- Transportation
- Photonics and Electrooptics
- Engineering Profession
- Aerospace
- Geoscience
- Nuclear Engineering
- Career Development
- Emerging Technologies
- Telecommunications
- English for Technical Professionals
Joan Figueras
Also published under:J. Figueras
Affiliation
Department of Electronics Engineering, Universitat Politècnica de Catalunya, Barcelona, Spain
Topic
Monte Carlo Simulation,Indirect Measure,Indirect Test,Nominal Value,Parasitic Capacitance,Training Phase,Alternative Test,Analogous Test,Area Overhead,Capacitive Elements,Electric Simulation,Impedance,Inverter,Measure Space,Metal-insulator-metal,Presence Of Defects,Simulation Results,Subset Of Measures,Thermal Expansion,Through Silicon Via,Training Set,Weak Fault,3D Graph,Acceptance Region,Alternative Measures,Analog Circuits,Aperiodic,Binning Procedure,Binning Strategy,Bivariate Data,Black Trace,Butterworth Filter,CMOS Technology,Capacitive Coupling,Circuit Behavior,Circuit Performance,Considerable Advantages,Cost Of Testing,Current Impact,Data Sheet,Deeper Level,Definition Of Boundaries,Degree Of Compliance,Design Specifications,Digital Input,Dimensional Space,Discussion Of The Results,Duty Cycle,Dynamic Scaling,Dynamic Voltage Scaling,
Biography
Joan Figueras (M’88) received the Ph.D. degree from the Universitat Politècnica de Catalunya (UPC), Barcelona, Spain, in 1965 and the M.Sc. and Ph.D. degrees from the University of Michigan, Ann Arbor, MI, USA in 1966 and 1971, respectively. He is currently with the Department of Electronics Engineering, UPC, where he has research and teaching responsibilities in the areas of electronics and digital- and mixed-signal design and test. He has an extensive publication record and has presented seminars and tutorials in professional meetings, and NATO seminars on topics related to “Low Power Design” and “Quality in Electronics.” His current research interests include low-power design and advanced test of electronic circuits and systems. Dr. Figueras was an Editor of the Journal of Electronic Testing: Theory and Applications (JETTA) and an Associated Editor of the IEEE Transactions on Computer- Aided Design of Integrated Circuits and Systems, and is a member of the steering and program committees of several test and low power design conferences.