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W. Abadeer
Also published under:W. W. Abadeer, Wagdi W. Abadeer
Affiliation
IBM Systems & Technology Group, Essex Junction, VT, USA
Topic
Device Simulation,Gate Oxide,Antenna Effect,Bias Conditions,Bulk Silicon,CMOS Technology,Charge Carriers,Coplanar Waveguide,Damaged Region,Decrease In Slope,Degradation Capacity,Degradation Mechanism,Dense Regions,Device Reliability,Dimensions Of Scale,Dominant Noise Source,Dominant Source,Doping Profile,Duration Of Stress,End Of The Channel,Fractional Recovery,Function Of Time,Function Of Voltage,Gate Dielectric,Harmonic Power,Hot Electrons,Input-referred Noise,Insertion Loss,Interface States,Inversion Layer,Junction Area,Key Properties,Log Time,Low-frequency Noise,Noise Degradation,Noise Sources,Nonlinear Optical,Oxide Thickness,P-n Junction,Parameters K2,Phase Noise,Power Handling,Power-law Dependence,RF Switch,Recovery Effect,Reverse Bias Voltage,Saturation Region,Silicide,Silicon Devices,Silicon-on-insulator,
Biography
W. W. Abadeer (M'78) received the B.S. degree in electrical engineering from Assiut University, Egypt, in 1966 and the M.S. and Ph.D. degrees in electrical engineering from the University of Vermont in 1970 and 1976, respectively.
From 1968 to 1976, he received teaching and research fellowships at the University of Vermont. He is presently a Senior Engineer with the Quality and Reliability Engineering group at the Burlington facility of the IBM Microelectronics Division, Essex Junction, VT. He joined IBM at the Burlington facility in 1976 and has since worked on the reliability of semiconductor devices. He has published extensively and holds several patents.
Dr. Abadeer is a member of the Electrochemical Society.
From 1968 to 1976, he received teaching and research fellowships at the University of Vermont. He is presently a Senior Engineer with the Quality and Reliability Engineering group at the Burlington facility of the IBM Microelectronics Division, Essex Junction, VT. He joined IBM at the Burlington facility in 1976 and has since worked on the reliability of semiconductor devices. He has published extensively and holds several patents.
Dr. Abadeer is a member of the Electrochemical Society.