Muhammad Nadeem Akram

Also published under:M. N. Akram, M. Nadeem Akram, M. Akram, Muhammed Nadeem Akram, Muhammad Imran Akram

Affiliation

University of South-Eastern Norway, Vestfold, Norway

Topic

Beam Voltage,Cavity Volume,Electron Beam,Failure Mechanism,Finite Element,Fracture Strength,Frequency Range,Hermetic Packaging,Incident Angle,Infrared Imaging,Infrared Light,Maximum Displacement,Maximum Stress,Modulation Transfer Function,Phase Retrieval,Rectangular Waveguide,Silicon Crystal,Slow Wave Structure,Traveling Wave Tube,Vacuum Level,Absorption Efficiency,Acoustic Imaging,Acoustic Transducer,Adaptive Algorithm,Airtight,Antireflection Coatings,Aperture Diameter,Atomic Force Microscopy,Average Impedance,Average Root Mean Square Error,Axial Field,Background Noise,Beam Cross-section,Blast Furnace,Broadband,COMSOL Simulation,Cap Thickness,Capability Of Model,Cartilage Growth,Changes In Gain,Chip Size,Citric Acid,Coherent Sources,Compact Support,Computational Efficiency,Computed Tomography,Computer Numerical Control,Convolutional Neural Network,Core Material,Cryoprobe,

Biography

Muhammad Nadeem Akram was born in Faisalabad, Pakistan, in 1971. He received the B.S. degree in electrical engineering from the University of Engineering and Technology Lahore, Lahore, Pakistan, in 1994, the M.S. degree in electrical engineering from the King Fahd University of Petroleum & Minerals, Dhahran, Saudi Arabia, in 2000, and the Ph.D. degree in microwave and photonics engineering from the KTH Royal Institute of Technology, Stockholm, Sweden, in 2005.
He is currently a Professor of photonics with the University of South-Eastern Norway, Horten, Norway. His research has been concerned with semiconductor lasers, imaging optics, speckle reduction, and computational imaging.