Walid G. Aref

Also published under:W. G. Aref, Walid Aref, W. C. Aref

Affiliation

Department of Computer Science, Purdue University, West Lafayette, USA

Topic

Leaf Node,Range Query,Access System,Average Processing Time,Baseline Solution,Benchmark,Binary Classification,Block Size,Bloom Filter,Capacity Of Nodes,Changes In Workload,Class Labels,Computational Core,Current Round,Data Center,Data Storage,Data Streams,Decision Tree Classifier,Densification Process,Depth-first,Dimensional Space,Direct Access,Distribution System,Fast Network,Feature Engineering,File System,GB Memory,Grid Cells,Grid Size,Hash Function,Index Surgery,Information System,Insertion Operator,Internet Of Things,Key Size,Key-value Pairs,Learning Index,Learning Models,Limited Memory,Load Balancing,Local Data,Local Memory,Local Services,Machine Learning Models,Machine Learning Models For Prediction,Machine Learning Techniques,Malicious Activities,Malicious Users,Memory Allocation,Memory Regions,

Biography

Walid G. Aref is a professor of computer science at Purdue. His research interests are in extending the functionality of database systems in support of emerging applications, e.g., spatial, spatio-temporal, multimedia, biological, and sensor databases. He is also interested in query processing, indexing, data mining, and geographic information systems (GIS). His research has been supported by the US National Science Foundation, the National Institute of Health, Purdue Research Foundation, Qatar National Research Foundation, CERIAS, Panasonic, and Microsoft Corp. In 2001, he received the CAREER Award from the US National Science Foundation and in 2004, he received a Purdue University Faculty Scholar award. He is a member of Purdue’s CERIAS and Discovery Park Cyber Center. He is an associate editor of the ACM Transactions of Database Systems (ACM TODS) and has been an editor of the VLDB Journal. He is an executive committee member and the past chair of the ACM Special Interest Group on Spatial Information (SIGSPATIAL). He is a senior member of the IEEE and a member of the ACM.