Featured Authors

Petr Balling

Laboratory of Fundamental Metrology, Czech Metrology Institute, Prague, Czech Republic

M. V. Alonso

Centro Nacional de Metrología, El Marques, Queretaro, Mexico

Chunying Shi

National Institute of Metrology, Beijing, China

José María García

University of Seville, Seville, Spain

Juan C. Alonso

Smart Computer Systems Research and Engineering Lab (SCORE), Research Institute of Informatics Engineering (I3US), Universidad de Sevilla, Sevilla, Spain

Amador Durán

Universidad de Sevilla, Seville, Spain

Rafael Corchuelo

ETSI Informática, University of Sevilla, Sevilla, Spain

Josep Cirera

MCIA Research Center, Technical University of Catalonia (UPC), Terrassa, Spain

Angel Molina-Garcia

Universidad Politécnica de Cartagena, 30202, Cartagena, Spain

Ahmed A. Helal

Department of Electrical and Control Engineering, Arab Academy for Science and Technology, Alexandria, Egypt