Featured Authors

K. Barla

Imec, Leuven, Belgium

Kristin De Meyer

Department of Electrical Engineering, Katholieke Universiteit, Leuven, Belgium

S. Adriaensen

Laboratoire de Microélectronique, Université catholique de Louvain, Louvain-la-Neuve, Belgium

Aryan Afzalian

Imec, Leuven, Belgium

Haig Atikian

School of Engineering and Applied Sciences. Harvard University, Cambridge, Massachusetts, USA

Ben Abbott

Skyworks Solutions, Inc., Irvine, CA, USA

Robert Aigner

Qorvo, Apopka, FL, USA

Enrique Pascual Gil

Airbus, Getafe, Spain

Jesus Alvarez

EMC Testing and Signature SP Team, Airbus Defense and Space, Getafe, Spain

Xiaojun Huang

College of Communication and Information Engineering, Xi'an University of Science and Technology, Xi'an, China