An Efficient Two-Stage Block Preselection SRAM PUF Exploiting Data Remanence

This paper introduces a novel two-stage block preselection Static Random Access Memory Physical Unclonable Function (SRAM PUF) implemented through the data remanence. This method involves only two tests: writing ‘1’ or ‘0’ to the entire SRAM and briefly interrupting the power until a few cells‘ power-up values change. The testing process is straightforward and does not require additional tilt testing circuits or precise analog voltages. To reduce the dispersion of responses and minimize error correction resources, the entire SRAM array is partitioned into equally sized blocks, and the response is segmented into two equal-length sections, with each section comprising SRAM cells biased towards ‘1’ in the strongest block and SRAM cells biased towards ‘0’ in the strongest block. During the reconstruction phase, the two response segments can be recovered using the same fuzzy extractor. The test results show a stability achievement of 99.74% and a bit error rate (BER) of 9.76E-8. In comparison to 500 times of Temporary Majority Voting (TMV), stability improves by 1.01% with a corresponding reduction in BER to 8.00E3. Additionally, error correction resources can be reduced by 48.6%. The proposed method holds significant engineering application value.